Pandey A, Mohanraj S. Defect Detection Approach in Manufacturing Environments using Customizable Convolutional Neural Networks with Multi-Scale Attention Mechanisms. J Neonatal Surg [Internet]. 2025Feb.2 [cited 2025Dec.4];14(2S):828-39. Available from: https://www.jneonatalsurg.com/index.php/jns/article/view/9567